“Scanning electron microscopy (SEM) is a game-changing technique for the morphological, texture, failure analysis and microstructural composition analysis and the analysis of contaminants present in samples.”
Scanning Electron Microscopy is a test process that produces a magnified image of a sample using an electron beam for analysis. It is highly effective in micro-analysis and failure mode analysis of materials and composites.

SEM analysis can facilitate the analysis of microscopic and nanoscopic materials and objects with great precision. There are two methods of electron detection when using SEM. Backscattered electrons can help with the analysis of the elemental composition of the sample and the secondary electrons emitted close to the surface can reveal relevant information about the topography and morphology of the sample’s surface. Combined with EDX, it can facilitate better analysis of the chemical and elemental composition of the samples.

Our operation of optical microscopes
At our labs and research centers, we make sure to use only the best equipment pieces so that no error can appear in the final results we will provide. Several precautions are maintained so that the sample under consideration does not get damaged during the study.

We ensure that during each new sample test, a sterile and disinfected slide is used for better results. NISHKA professionals ensure that all the arrangement is perfect and no single object is out of the place so that the final data recorded can have the least flaws. The entire material is studied thoroughly with different samples belonging to the same category until the optima studies are obtained.